Research Field B: Diagnostic and Test
To ensure the secure operation of embedded systems, diagnostic and test methods have to be developed. In the case of embedded microsystems, methods for the integrated test of the software and the electronic and mechanical functionality of the system will be complemented by methods for the self-test and self-calibration during operation.
Projekte im Forschungsbereich B Diagnose und Test
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B.1 Test Methods For MEMS
Accurate and low-cost test procedures are of great importance for mass production of MEMS. The experience with digital CMOS ICs suggests that even well-controlled manufacturing processes result in yields below 100% and each individual IC has to be tested before shipment. While the testability of digital circuits has been studied extensively, the micromechanical components of MEMS result in new test challenges. Designing a MEMS such that it is easy to test later on (design-for-testability) may be away to deal with that challenges. For instance, blocks for generating test stimuli directly on-chip could be added to the system (self-test). A further advantage of having such structures is the option to perform test in field (online test).
A test system for concurrent electrical and mechanical stimulation of MEMS devices jointly developed with the group of Prof. Dr. Oliver Paul as part of the Graduate School research and a microphotograph of a measurement.
Contact:
Prof. Dr. Bernd Becker
Chair of Computer Architecture
Department of Computer Science
Georges-Köhler-Allee 051, 79110 Freiburg
Phone: +49-761-203-8141 | Fax: +49-761-203-8142 | E-mail
B.2 Self-Diagnostics and Self-Calibration of Embedded Microsystems
In this project we develop methods for the calibration and diagnostic monitoring of thermal and mechanical microsystems. The central question to be addressed is whether the sensitivity of a microsensor or microsystem can be determined by taking advantage of internal effects without the use of the external input measured during usual operation of the device. Further, the plan is to investigate and develop methods for monitoring the drift of microsystem, in view of the early detection of imminent failure events. On a more abstract level, the question is asked how small a minimal microsystem core able to verify the full functionality of the microsystem can be.
Contact:
Prof. Dr. Oliver Paul
Chair of Microsystem Materials
Department of Microsystems Engineering
Georges-Köhler-Allee 103, 79110 Freiburg
Phone: +49-761-203-7191 | Fax: +49-761-203-7192 | E-mail